A transportability microcosm as an enabler for a family of testers

Author

Marion, Randall L.

Author_Institution

Ground Support Syst., Boeing Co., St. Louis, MO, USA

fYear

2011

fDate

12-15 Sept. 2011

Firstpage

60

Lastpage

65

Abstract

The paper will analyze a single simple instrument type to focus on ensuring transportability across a family of automated test equipment (ATE) testers. Transportability analysis and multiple hosting across a family of testers are important topics in advanced test and diagnosis of electronic assemblies. The ATE instrument type selected is direct current (DC) power supplies, where application of a DC voltage is complicated by impedance, transient and load characteristics. The ideal condition of a test program set (TPS) is the ability to tolerate the conditions described, but that condition is rarely achieved. Therefore, the family of testers must exhibit consistent behavior regardless of instrument manufacturer.

Keywords

automatic test equipment; circuit testing; maintenance engineering; power supply circuits; advanced testing; automated test equipment tester; direct current power supplies; electronic assembly diagnosis; instrument type; test program set; tester family; transportability microcosm; Circuit faults; Impedance; Instruments; Power supplies; Switches; Throughput; Timing; family of testers; interoperability; transportability;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON, 2011 IEEE

Conference_Location

Baltimore, MD

ISSN

1088-7725

Print_ISBN

978-1-4244-9362-3

Type

conf

DOI

10.1109/AUTEST.2011.6058756

Filename

6058756