Title :
A transportability microcosm as an enabler for a family of testers
Author :
Marion, Randall L.
Author_Institution :
Ground Support Syst., Boeing Co., St. Louis, MO, USA
Abstract :
The paper will analyze a single simple instrument type to focus on ensuring transportability across a family of automated test equipment (ATE) testers. Transportability analysis and multiple hosting across a family of testers are important topics in advanced test and diagnosis of electronic assemblies. The ATE instrument type selected is direct current (DC) power supplies, where application of a DC voltage is complicated by impedance, transient and load characteristics. The ideal condition of a test program set (TPS) is the ability to tolerate the conditions described, but that condition is rarely achieved. Therefore, the family of testers must exhibit consistent behavior regardless of instrument manufacturer.
Keywords :
automatic test equipment; circuit testing; maintenance engineering; power supply circuits; advanced testing; automated test equipment tester; direct current power supplies; electronic assembly diagnosis; instrument type; test program set; tester family; transportability microcosm; Circuit faults; Impedance; Instruments; Power supplies; Switches; Throughput; Timing; family of testers; interoperability; transportability;
Conference_Titel :
AUTOTESTCON, 2011 IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4244-9362-3
DOI :
10.1109/AUTEST.2011.6058756
