DocumentCode :
2008106
Title :
A system-level approach to designing modular switching software
Author :
Sarfi, Tom
Author_Institution :
VTI Instrum. Corp., Irvine, CA, USA
fYear :
2011
fDate :
12-15 Sept. 2011
Firstpage :
428
Lastpage :
434
Abstract :
The system switch plays a crucial role in any automated test system as it provides ATE engineers the ability to distribute a finite amount of instrumentation I/O to multiple test points. The popularity of modular architectures such as VXI and PXI, created an opportunity for consolidation of instrumentation and switching within a single mainframe, resulting in high-channel count capability in a reduced footprint. A modular approach to switching systems also affords the ATE architect design flexibility through the use of domain-specific modules (i.e, power, RF, and analog) that can be combined to cover a broad range of the signal spectrum. Unfortunately, software development and integration can become unnecessarily complicated when the system switch is viewed simply as a collection of discrete modules that are assembled to accommodate the required I/O count. This paper will discuss web-based methodologies and software platforms that VTI Instruments has developed to create a versatile system-level switching programming environment. This framework, which is implemented on web-enabled LXI-based modular switch instruments, significantly reduces test program set development time and simplifies debugging and design validation activities without the overhead of third party configuration tools.
Keywords :
input-output programs; program debugging; program testing; software engineering; virtual instrumentation; ATE engineers; I/O instrumentation; LXI based modular switch instruments; PXI; VTI Instruments; VXI; automated test system; modular switching software design; program debugging; signal spectrum; software development; software integration; Instruments; Radio frequency; Relays; Software; Switches; Switching systems; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2011 IEEE
Conference_Location :
Baltimore, MD
ISSN :
1088-7725
Print_ISBN :
978-1-4244-9362-3
Type :
conf
DOI :
10.1109/AUTEST.2011.6058757
Filename :
6058757
Link To Document :
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