Title :
BIT/BITE/ED/EP/IVHM and ATE in DA
Author :
Yarnall, Willis H. ; Moore, Charles R. ; Dussault, Phil L.
Author_Institution :
Eng. Support Div., AMRDEC, Redstone, AL, USA
Abstract :
Automatic test equipment (ATE) in the Department of the Army (DA) finds itself in an ever challenging and changing role in an effort to support the Future Force of the 21st century. Challenging in that the ATE today must combat obsolescence while supporting both the legacy and future systems; and changing in that Army Transformation is transitioning from four (4) to two (2) levels of maintenance support. Advances in technology in the areas of built-in-test (BIT), built-in-test equipment (BITE), embedded diagnostics (ED), embedded prognostics (EP) and integrated vehicle health management (IHVM) have been the primary enablers allowing the DA to make major changes in maintenance, test philosophy and logistics in order to reduce cost, schedule and time. BIT/BITE/ED/EP/IVHM and ATE complement one another and each play a valuable and vital role in the maintenance and logistics support of the Future Force.
Keywords :
automatic test equipment; built-in self test; military computing; military equipment; ATE; BITE; DA; Department of the Army; ED; EP; IVHM; army transformation; automatic test equipment; built-in-test equipment; embedded diagnostics; embedded prognostics; integrated vehicle health management; Circuit faults; Force; Logistics; Maintenance engineering; Test equipment; US Department of Defense; Weapons;
Conference_Titel :
AUTOTESTCON, 2011 IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4244-9362-3
DOI :
10.1109/AUTEST.2011.6058763
