• DocumentCode
    2008266
  • Title

    Rapid development and porting of new waveforms for Synthetic Instrumentation

  • Author

    Parkey, Charna R.

  • Author_Institution
    Astronics DME Corp., Orlando, FL, USA
  • fYear
    2011
  • fDate
    12-15 Sept. 2011
  • Firstpage
    22
  • Lastpage
    25
  • Abstract
    Changing standards and newly defined waveforms make keeping up with test requirements without the purchase of new, expensive measurement systems or software is desirable. The Long Term Evolution (LTE) Advanced, Association of Public-Safety Communications Officials Project 25 (APCO-25 or P25), and TErrestrial Trunked RAadio (TETRA) standards are a few examples of developing standards changing requirements for test equipment. With the move to digital communications, test systems are faced with additional new test requirements and methods of measurement. Instead of implementing independent specific waveform options into the Digital Signal Processing (DSP) algorithms of the synthetic instrument a more generic algorithm design method is implemented and described in this paper. With the development of generic digital modulation and demodulation algorithms, rapid development and porting of new waveforms becomes possible.
  • Keywords
    Long Term Evolution; demodulation; digital radio; digital signal processing chips; measurement standards; measurement systems; telecommunication standards; test equipment; Terrestrial Trunked Raadio Standards; demodulation algorithm; digital communication; digital signal processing algorithm; generic algorithm design method; generic digital modulation; long term evolution; measurement system; public safety communication official project; synthetic instrumentation; test equipment; test requirement; test systems; Instruments; Quadrature amplitude modulation; Silicon; Software; Standards; Testing; APCO-25; Digital Modulation; Measurement; Synthethic Instrumentaion; TETRA; Test; Waveforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2011 IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-9362-3
  • Type

    conf

  • DOI
    10.1109/AUTEST.2011.6058764
  • Filename
    6058764