DocumentCode :
2008429
Title :
Triaxial force measurement cantilever by sidewall-doping with rapid thermal diffusion
Author :
Aoyama, Yuichiro ; Binh-Khiem, Nguyen ; Noda, Kentaro ; Takei, Yusuke ; Kan, Tetsuo ; Iwase, Eiji ; Matsumoto, Kiyoshi ; Shimoyama, Isao
Author_Institution :
Univ. of Tokyo, Tokyo, Japan
fYear :
2010
fDate :
24-28 Jan. 2010
Firstpage :
619
Lastpage :
622
Abstract :
We propose a triaxial force measurement cantilever with piezoresistors fabricated by rapid thermal diffusion sidewall-doping. The device is developed as a tool for applying quantitative mechanical stimuli to cells and measuring their mechanical properties at the same time. The device consists of a sensing tip, two sensing beams, and four wiring beams. We form piezoresistors on the surface of the sensing tip and the sidewalls of the two sensing beams. We confirmed that our device was able to measure triaxial forces. The displacement sensitivities of the device were 1.59×10-3 ¿m-1, 1.18×10-3 ¿m-1 and 3.26×10-4 ¿m-1 for x, y, and z-direction, respectively.
Keywords :
biological techniques; cantilevers; force measurement; gold; microsensors; piezoresistive devices; rapid thermal processing; resistors; semiconductor doping; silicon; thermal diffusion; Au; Si; cell mechanical property; displacement sensitivity; mechanical stimuli; piezoresistor; rapid thermal diffusion sidewall doping; triaxial force measurement cantilever; Electrical resistance measurement; Force measurement; Force sensors; Mechanical factors; Mechanical variables measurement; Piezoresistive devices; Probes; Stress measurement; Thermal force; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2010 IEEE 23rd International Conference on
Conference_Location :
Wanchai, Hong Kong
ISSN :
1084-6999
Print_ISBN :
978-1-4244-5761-8
Electronic_ISBN :
1084-6999
Type :
conf
DOI :
10.1109/MEMSYS.2010.5442332
Filename :
5442332
Link To Document :
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