Complex ternary mixed layered tetradymite-like chalcogenides as novel thermoelectrics

Author

Shelimova, L.E. ; Konstantinov, P.P. ; Karpinsky, O.G. ; Avilov, E.S. ; Kretova, M.A. ; Fleurial, J.P.

Author_Institution

Inst. of Metall. & Mater. Sci., Acad. of Sci., Moscow, Russia

fYear

1999

fDate

Aug. 29 1999-Sept. 2 1999

Firstpage

536

Lastpage

540

Abstract

The nGeTe-mBi/sub 2/Te/sub 3/ and nGeTe-mSb/sub 2/Te/sub 3/ homologous series mixed layered (Mt.) compounds have been investigated by X-ray diffraction. A variety of the ML long-period structures is discovered in the GeTe-Bi/sub 2/Te/sub 3/ and GeTe-Sb/sub 2/Te/sub 3/ quasi-binary systems. Temperature dependencies of Hall coefficient, electrical resistivity and Seebeck coefficient have been measured in a wide temperature range. A mixed carrier scattering mechanism on acoustic phonons and point defects is proposed to explain the carrier mobility temperature dependence at low temperatures. It is found that the ML compounds are characterized by extremely low lattice thermal conductivity at 300 K: /spl kappa//sub ph/=5-7 mW/cm K.

Keywords

Hall effect; Seebeck effect; X-ray diffraction; antimony compounds; bismuth compounds; carrier mobility; electrical resistivity; germanium compounds; thermal conductivity; thermoelectric power; GeTe-Bi/sub 2/Te/sub 3/; GeTe-Sb/sub 2/Te/sub 3/; Hall coefficient; Seebeck coefficient; X-ray diffraction; acoustic phonons; carrier mobility temperature dependence; complex ternary mixed layered tetradymite-like chalcogenides; electrical resistivity; extremely low lattice thermal conductivity; mixed carrier scattering mechanism; nGeTe-mBi/sub 2/Te/sub 3/; nGeTe-mSb/sub 2/Te/sub 3/; point defects; thermoelectrics; Acoustic measurements; Acoustic scattering; Electric resistance; Electric variables measurement; Tellurium; Temperature dependence; Temperature distribution; Thermal conductivity; X-ray diffraction; X-ray scattering;

fLanguage

English

Publisher

ieee

Conference_Titel

Thermoelectrics, 1999. Eighteenth International Conference on

Conference_Location

Baltimore, MD, USA

ISSN

1094-2734

Print_ISBN

0-7803-5451-6

Type

conf

DOI

10.1109/ICT.1999.843446

Filename

843446