• DocumentCode
    2008649
  • Title

    An overview of the ATML family and related standards

  • Author

    Gorringe, Chris ; Seavey, Mike ; Lopes, Teresa

  • Author_Institution
    Cassidian Test Eng. Services, Ferndown, UK
  • fYear
    2011
  • fDate
    12-15 Sept. 2011
  • Firstpage
    117
  • Lastpage
    123
  • Abstract
    The “IEEE Full-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML” (IEEE Std 1671™-2010) and all its `dot´ standards have been published and are available from the IEEE. The ATML standards working group are currently revising these trial use `dot´ standards to match their current development eXtendable Markup Language (XML) schemas in line with the full use IEEE Std 1671. The “Common” ATML XML schemas are posted to an IEEE download site on the World Wide Web, available for download and use. In short, the ATML standard and it´s `dot´ companions are now published, available, and their associated XML Schemas are downloadable from the Web, and in use across industry.
  • Keywords
    IEEE standards; Internet; Web sites; XML; automatic test equipment; automatic test software; ATML XML schemas; ATML standards; IEEE Std 1671; IEEE full-use standard; World Wide Web; automatic test equipment; automatic test markup language; extendable markup language schemas; Automatic test equipment; IEEE standards; Instruments; Unified modeling language; XML; Application Domain; Capabilities; IEEE 1641; IEEE 1671; Instrument Description; Signal Modeling; Test Adaptor Description; Test Configuration; Test Description; Test Results; Test Station Description; UUT Description; WireList;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2011 IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-9362-3
  • Type

    conf

  • DOI
    10.1109/AUTEST.2011.6058783
  • Filename
    6058783