DocumentCode :
2008649
Title :
An overview of the ATML family and related standards
Author :
Gorringe, Chris ; Seavey, Mike ; Lopes, Teresa
Author_Institution :
Cassidian Test Eng. Services, Ferndown, UK
fYear :
2011
fDate :
12-15 Sept. 2011
Firstpage :
117
Lastpage :
123
Abstract :
The “IEEE Full-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML” (IEEE Std 1671™-2010) and all its `dot´ standards have been published and are available from the IEEE. The ATML standards working group are currently revising these trial use `dot´ standards to match their current development eXtendable Markup Language (XML) schemas in line with the full use IEEE Std 1671. The “Common” ATML XML schemas are posted to an IEEE download site on the World Wide Web, available for download and use. In short, the ATML standard and it´s `dot´ companions are now published, available, and their associated XML Schemas are downloadable from the Web, and in use across industry.
Keywords :
IEEE standards; Internet; Web sites; XML; automatic test equipment; automatic test software; ATML XML schemas; ATML standards; IEEE Std 1671; IEEE full-use standard; World Wide Web; automatic test equipment; automatic test markup language; extendable markup language schemas; Automatic test equipment; IEEE standards; Instruments; Unified modeling language; XML; Application Domain; Capabilities; IEEE 1641; IEEE 1671; Instrument Description; Signal Modeling; Test Adaptor Description; Test Configuration; Test Description; Test Results; Test Station Description; UUT Description; WireList;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2011 IEEE
Conference_Location :
Baltimore, MD
ISSN :
1088-7725
Print_ISBN :
978-1-4244-9362-3
Type :
conf
DOI :
10.1109/AUTEST.2011.6058783
Filename :
6058783
Link To Document :
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