Abstract :
The following topics are dealt with: DoD ATS family; vector network analyzer; ATE measurement; synthetic instrumentation; scalable benchtop test system; IEEE P1693 MIPSS standard; RF test platform; business case template; organizational-level testers; intermittent failure detection routine; transportability microcosm; TPS transport optimization; integrated model-based fault detection; data-driven fault detection; fault diagnosis; automotive electric power steering system; nondestructive high voltage low energy intermittent fault location system; electrical ground support equipment development; satellite testing; command and telemetry processing interface; system design issues; connector diagnosis; wiring diagnosis; cable diagnosis; signal generation; software design issues; data analysis; ATS architecture; information management; analog health assessment; test measurement; DoD Initiatives; economic issues; and switching system.
Keywords :
aerospace testing; automatic test equipment; command and control systems; data analysis; failure analysis; fault diagnosis; ground support systems; information management; network analysers; software architecture; software tools; statistical analysis; telemetry; testing; wiring; ATE measurement; ATS architecture; DoD ATS family; DoD Initiatives; IEEE P1693 MIPSS standard; RF test platform; TPS transport optimization; analog health assessment; automotive electric power steering system; business case template; cable diagnosis; command and telemetry processing interface; connector diagnosis; data analysis; data-driven fault detection; economic issues; electrical ground support equipment development; fault diagnosis; information management; integrated model-based fault detection; intermittent failure detection routine; nondestructive high voltage low energy intermittent fault location system; organizational-level testers; satellite testing; scalable benchtop test system; signal generation; software design issues; switching system; synthetic instrumentation; system design issues; test measurement; transportability microcosm; vector network analyzer; wiring diagnosis;
Conference_Titel :
AUTOTESTCON, 2011 IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4244-9362-3
DOI :
10.1109/AUTEST.2011.6058797
