Title :
"Static Or Dynamic", The Selection Process For A Memory System
Author_Institution :
National Semiconductor Corporation
Keywords :
Costs; Helium; Logic devices; Pricing; Production; Semiconductor device packaging; Semiconductor device reliability; Semiconductor device testing; Semiconductor memory; System testing;
Conference_Titel :
COMPCON Fall '77
DOI :
10.1109/CMPCON.1977.680816