DocumentCode
2009235
Title
Future of PECVD and spin-on ultra low-k materials
Author
Volksen, W. ; Frot, T. ; Magbitang, T. ; Gates, S. ; Oliver, Mark ; Dauskardt, R. ; Dubois, G.
Author_Institution
Almaden Res. Center, IBM, San Jose, CA, USA
fYear
2011
fDate
8-12 May 2011
Firstpage
1
Lastpage
3
Abstract
A few years ago, we developed at the IBM Almaden Research Center, the concept of introducing carbon in low-k materials in the form of bridging units between the silicon atoms and not as a pendant methyl group. Since then, this strategy has been widely adopted among the semi-conductor industry and the most advanced spin-on and PECVD ULK materials are now based on this model. This paper addresses the concept of designing ultra low-k bridged materials to achieve the best mechanical properties, to control the pore size and connectivity and to prevent plasma damage.
Keywords
chemical vapour deposition; semiconductor industry; PECVD ULK materials; pendant methyl group; plasma damage; semiconductor industry; silicon atoms; spin-on ultra low-k materials; ultra low-k bridged materials; Carbon; Dielectric constant; Films; Mechanical factors; Plasmas; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Interconnect Technology Conference and 2011 Materials for Advanced Metallization (IITC/MAM), 2011 IEEE International
Conference_Location
Dresden
ISSN
pending
Print_ISBN
978-1-4577-0503-8
Type
conf
DOI
10.1109/IITC.2011.5940287
Filename
5940287
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