Title :
Future of PECVD and spin-on ultra low-k materials
Author :
Volksen, W. ; Frot, T. ; Magbitang, T. ; Gates, S. ; Oliver, Mark ; Dauskardt, R. ; Dubois, G.
Author_Institution :
Almaden Res. Center, IBM, San Jose, CA, USA
Abstract :
A few years ago, we developed at the IBM Almaden Research Center, the concept of introducing carbon in low-k materials in the form of bridging units between the silicon atoms and not as a pendant methyl group. Since then, this strategy has been widely adopted among the semi-conductor industry and the most advanced spin-on and PECVD ULK materials are now based on this model. This paper addresses the concept of designing ultra low-k bridged materials to achieve the best mechanical properties, to control the pore size and connectivity and to prevent plasma damage.
Keywords :
chemical vapour deposition; semiconductor industry; PECVD ULK materials; pendant methyl group; plasma damage; semiconductor industry; silicon atoms; spin-on ultra low-k materials; ultra low-k bridged materials; Carbon; Dielectric constant; Films; Mechanical factors; Plasmas; Silicon;
Conference_Titel :
Interconnect Technology Conference and 2011 Materials for Advanced Metallization (IITC/MAM), 2011 IEEE International
Conference_Location :
Dresden
Print_ISBN :
978-1-4577-0503-8
DOI :
10.1109/IITC.2011.5940287