Title :
Thermal conductivity characterization of skutterudite thin films
Author :
Song, D.W. ; Caylor, C. ; Liu, W.L. ; Zeng, T. ; Borca-Tasciuc, T. ; Sands, T.D. ; Chen, G.
Author_Institution :
Dept. of Mech. & Aerosp. Eng., California Univ., Los Angeles, CA, USA
fDate :
Aug. 29 1999-Sept. 2 1999
Abstract :
Experimental results on the temperature dependent cross-plane thermal conductivity of skutterudite thin films are presented. The films examined include IrSb/sub 3/ (175 nm) and CoSb/sub 3/ (110 nm) single layers, an Ir/sub 0.5/Co/sub 0.5/Sb/sub 3/ alloy film (150 nm), and an IrSb/sub 3//CoSb/sub 3/ superlattice (6 nm period) that are grown by pulsed laser deposition. A differential 3/spl omega/ method is used to measure the cross-plane thermal conductivity of these films from 80 K to 300 K. The experimental results show a significant reduction in their thermal conductivity values compared to those of their corresponding bulk samples reported in literature, with the largest reduction observed in the alloy and the superlattice samples. These data suggest that the phonons carrying heat in bulk superlattices have long mean free path. The thermal conductivity of the alloy and the superlattice thin film samples are comparable to some filled skutterudites.
Keywords :
cobalt alloys; iridium alloys; metallic superlattices; metallic thin films; pulsed laser deposition; thermal conductivity; thermoelectric power; 110 nm; 150 nm; 175 nm; 6 nm; 80 to 300 K; CoSb/sub 3/; Ir/sub 0.5/Co/sub 0.5/Sb/sub 3/; IrSb/sub 3/; IrSb/sub 3/-CoSb/sub 3/; IrSb/sub 3//CoSb/sub 3/ superlattice; differential 3/spl omega/ method; long mean free path; pulsed laser deposition; skutterudite thin films; temperature dependent cross-plane thermal conductivity; thermal conductivity characterization; Cobalt alloys; Conductive films; Conductivity measurement; Optical pulses; Pulsed laser deposition; Superlattices; Temperature dependence; Thermal conductivity; Tin alloys; Transistors;
Conference_Titel :
Thermoelectrics, 1999. Eighteenth International Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-5451-6
DOI :
10.1109/ICT.1999.843478