DocumentCode
2009715
Title
Session TA2: Design for Testability and Reliability
fYear
2004
fDate
12-15 Sept. 2004
Firstpage
217
Lastpage
217
Abstract
Start of the above-titled section of the conference proceedings record.
fLanguage
English
Publisher
ieee
Conference_Titel
SOC Conference, 2004. Proceedings. IEEE International
Conference_Location
Santa Clara, CA, USA
Print_ISBN
0-7803-8445-8
Type
conf
DOI
10.1109/SOCC.2004.1362412
Filename
1362412
Link To Document