DocumentCode
2009786
Title
On-chip network based embedded core testing
Author
Kim, Jong-Sun ; Hwang, Min-Su ; Roh, Seungsu ; Lee, Ja-Young ; Lee, Kangmin ; Lee, Se-Joong ; Yoo, Hoi-Jun
Author_Institution
Dept. of R&D, Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
fYear
2004
fDate
12-15 Sept. 2004
Firstpage
223
Lastpage
226
Abstract
In this paper, network-based embedded core testing (NET) architecture is proposed. The test of individual embedded cores and their interconnection are possible in a system-on-chip (SoC) environment by using configurable on-chip network (OCN) architecture. And the test time can be reduced because the proposed test access mechanism provides high bandwidth for test patterns transport. In addition, since the core access path during test shares with the communication architecture of the SoC, the area overhead can be reduced. A network-on-chip (NoC) application with the proposed NET architecture is implemented. The operation and the performance of NET architecture are described.
Keywords
computer architecture; computer testing; embedded systems; system-on-chip; NET architecture; OCN architecture; area overhead reduction; communication architecture; configurable on-chip network; intellectual property; network-based embedded core testing; network-on-chip; system-on-chip; test access mechanism; test pattern transport; Bandwidth; Clocks; Frequency synchronization; Network-on-a-chip; Packet switching; Routing; Scalability; Switches; System testing; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
SOC Conference, 2004. Proceedings. IEEE International
Print_ISBN
0-7803-8445-8
Type
conf
DOI
10.1109/SOCC.2004.1362415
Filename
1362415
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