• DocumentCode
    2009786
  • Title

    On-chip network based embedded core testing

  • Author

    Kim, Jong-Sun ; Hwang, Min-Su ; Roh, Seungsu ; Lee, Ja-Young ; Lee, Kangmin ; Lee, Se-Joong ; Yoo, Hoi-Jun

  • Author_Institution
    Dept. of R&D, Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
  • fYear
    2004
  • fDate
    12-15 Sept. 2004
  • Firstpage
    223
  • Lastpage
    226
  • Abstract
    In this paper, network-based embedded core testing (NET) architecture is proposed. The test of individual embedded cores and their interconnection are possible in a system-on-chip (SoC) environment by using configurable on-chip network (OCN) architecture. And the test time can be reduced because the proposed test access mechanism provides high bandwidth for test patterns transport. In addition, since the core access path during test shares with the communication architecture of the SoC, the area overhead can be reduced. A network-on-chip (NoC) application with the proposed NET architecture is implemented. The operation and the performance of NET architecture are described.
  • Keywords
    computer architecture; computer testing; embedded systems; system-on-chip; NET architecture; OCN architecture; area overhead reduction; communication architecture; configurable on-chip network; intellectual property; network-based embedded core testing; network-on-chip; system-on-chip; test access mechanism; test pattern transport; Bandwidth; Clocks; Frequency synchronization; Network-on-a-chip; Packet switching; Routing; Scalability; Switches; System testing; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOC Conference, 2004. Proceedings. IEEE International
  • Print_ISBN
    0-7803-8445-8
  • Type

    conf

  • DOI
    10.1109/SOCC.2004.1362415
  • Filename
    1362415