DocumentCode :
2009786
Title :
On-chip network based embedded core testing
Author :
Kim, Jong-Sun ; Hwang, Min-Su ; Roh, Seungsu ; Lee, Ja-Young ; Lee, Kangmin ; Lee, Se-Joong ; Yoo, Hoi-Jun
Author_Institution :
Dept. of R&D, Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
fYear :
2004
fDate :
12-15 Sept. 2004
Firstpage :
223
Lastpage :
226
Abstract :
In this paper, network-based embedded core testing (NET) architecture is proposed. The test of individual embedded cores and their interconnection are possible in a system-on-chip (SoC) environment by using configurable on-chip network (OCN) architecture. And the test time can be reduced because the proposed test access mechanism provides high bandwidth for test patterns transport. In addition, since the core access path during test shares with the communication architecture of the SoC, the area overhead can be reduced. A network-on-chip (NoC) application with the proposed NET architecture is implemented. The operation and the performance of NET architecture are described.
Keywords :
computer architecture; computer testing; embedded systems; system-on-chip; NET architecture; OCN architecture; area overhead reduction; communication architecture; configurable on-chip network; intellectual property; network-based embedded core testing; network-on-chip; system-on-chip; test access mechanism; test pattern transport; Bandwidth; Clocks; Frequency synchronization; Network-on-a-chip; Packet switching; Routing; Scalability; Switches; System testing; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOC Conference, 2004. Proceedings. IEEE International
Print_ISBN :
0-7803-8445-8
Type :
conf
DOI :
10.1109/SOCC.2004.1362415
Filename :
1362415
Link To Document :
بازگشت