DocumentCode :
2009918
Title :
A leakage-tolerant low-leakage register file with conditional sleep transistor
Author :
Agarwal, Abhishek ; Kaushik, Rajashekara ; Krishnamurthy, Ram K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear :
2004
fDate :
12-15 Sept. 2004
Firstpage :
241
Lastpage :
244
Abstract :
This paper describes a 256×64b 3-read, 3-write ported leakage tolerant low leakage register file. The local bitline shares a sleep transistor for aggressive bitline leakage reduction/tolerance to enable high fanin bitlines and uses low Vth transistors. The sleep transistor is turned on while accessing the local bitline and conditionally turned off, if the dynamic node should remain high. Simulation results shows that proposed technique achieves 9% improvement in performance with 14× reduction in local bitline leakage (97× reduction as compared to any previously proposed low Vth, leakage tolerant register file) enabling 70% reduction in keeper size, while keeping the same noise robustness as optimized high performance conventional high Vth implementation.
Keywords :
integrated circuit design; leakage currents; logic circuits; logic design; transistors; 3-read ported register file; 3-write ported register file; aggressive bitline leakage reduction; aggressive bitline leakage tolerance; conditional sleep transistor; dynamic node; high fanin bitlines; keeper size reduction; leakage tolerant register file; leakage-tolerant low-leakage register file; local bitline leakage; CMOS technology; Circuit noise; Clocks; Decoding; Delay; Noise reduction; Noise robustness; Registers; Signal generators; Sleep;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOC Conference, 2004. Proceedings. IEEE International
Print_ISBN :
0-7803-8445-8
Type :
conf
DOI :
10.1109/SOCC.2004.1362421
Filename :
1362421
Link To Document :
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