Title :
Simultaneous bidirectional PAM-4 link with built-in self-test
Author :
Hsieh, Ming-la ; Sobelman, Gerald E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Minnesota Univ., Minneapolis, MN, USA
Abstract :
This paper presents a new design of a simultaneous bidirectional PAM-4 wired transmission system that uses built-in self-test (BIST) to adjust the level of pre-emphasis that is applied. The BIST circuitry consists of a pattern generator and detector, a signal comparator and a high-pass filter. It outputs an error indicator that is used as a control signal in the adaptive pre-emphasis block. The feedback loop inherent in a simultaneous bidirectional link provides a natural opportunity to carry information about the channel characteristics without the need for an extra dedicated wire. The design has been verified using the Cadence SpectreRF and Verilog-A simulators and the channel loss characteristics are based on an FR-4 material model extracted from the Cadence Transmission Line Model Generator.
Keywords :
built-in self test; comparators (circuits); high-pass filters; pulse amplitude modulation; telecommunication transmission lines; Cadence SpectreRF simulator; Cadence Transmission Line Model Generator; FR-4 material model; Verilog-A simulator; adaptive pre-emphasis block; built-in self-test; channel loss characteristics; control signal; error indicator; feedback loop; high-pass filter; pattern detector; pattern generator; signal comparator; simultaneous bidirectional PAM-4 link; wired transmission system; Adaptive control; Built-in self-test; Circuits; Detectors; Error correction; Feedback loop; Filters; Programmable control; Signal detection; Signal generators;
Conference_Titel :
SOC Conference, 2004. Proceedings. IEEE International
Print_ISBN :
0-7803-8445-8
DOI :
10.1109/SOCC.2004.1362426