DocumentCode
2010445
Title
Unified mixture-model based terrain estimation with Markov Random Fields
Author
Tse, Rina ; Ahmed, Nisar ; Campbell, Mark
Author_Institution
Sibley Sch. of Mech. & Aerosp. Eng., Cornell Univ., Ithaca, NY, USA
fYear
2012
fDate
13-15 Sept. 2012
Firstpage
238
Lastpage
243
Abstract
This paper proposes a Markov Random Field (MRF) representation for sensor and terrain information fusion in a 2.5D map. Unlike in the previous works, the proposed MRF formally models the sensor pose and measurement uncertainties, thus allowing the measurements to be appropriately fused with terrain information. Additionally, the MRF´s graphical modelbased representation allows for an easy modification to the probabilistic dependencies among variables, permitting a more flexible and general model including terrain spatial correlations to be studied. The use of an MRF representation also makes it easier to perform factorization and inference on any variable subset of interests. Results show that the addition of a terrain MRF model not only helps reduce the estimation error, but also serves as a basis for terrain property characterization, which is useful for future terrain analyses such as traversability assessments in ground robot navigation.
Keywords
Markov processes; estimation theory; inference mechanisms; measurement uncertainty; mobile robots; navigation; probability; sensor fusion; terrain mapping; MRF representation; Markov random fields; estimation error; graphical model based representation; ground robot navigation; inference; measurement uncertainty; mixture-model based terrain estimation; probabilistic dependency; sensor pose; terrain MRF model; terrain analyses; terrain information fusion; terrain property characterization; terrain spatial correlations; traversability assessments; variable subset; Adaptation models; Correlation; Estimation; Measurement uncertainty; Robot sensing systems; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Multisensor Fusion and Integration for Intelligent Systems (MFI), 2012 IEEE Conference on
Conference_Location
Hamburg
Print_ISBN
978-1-4673-2510-3
Electronic_ISBN
978-1-4673-2511-0
Type
conf
DOI
10.1109/MFI.2012.6343027
Filename
6343027
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