Title :
A new design for built-in self-test of 5GHz low noise amplifiers
Author :
Ryu, Jee-Youl ; Kim, Bruce C.
Author_Institution :
Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
Abstract :
This paper presents a new low-cost built-in self-test (BIST) circuit for 5GHz low noise amplifier (LNA). The BIST circuit is designed for system-on-chip (SOC) transceiver environment. The proposed BIST circuit measures the LNA specifications such as input impedance, voltage gain, noise figure, and input return loss all in a single SoC environment.
Keywords :
MMIC amplifiers; built-in self test; radiofrequency integrated circuits; system-on-chip; transceivers; 5 GHz; BIST circuit; LNA specifications; built-in self-test; input impedance; input return loss; low noise amplifiers; noise figure; system-on-chip transceiver; voltage gain; Built-in self-test; Circuit noise; Gain measurement; Impedance measurement; Loss measurement; Low-noise amplifiers; Noise measurement; System-on-a-chip; Transceivers; Working environment noise;
Conference_Titel :
SOC Conference, 2004. Proceedings. IEEE International
Print_ISBN :
0-7803-8445-8
DOI :
10.1109/SOCC.2004.1362450
