DocumentCode :
2010639
Title :
IEEE Std 4 "High voltage testing techniques" past, present and future IEEE/PES/PSIM High Voltage Testing Techniques Subcommittee Report
Author :
Larzelere, Bill ; Loving, Kevin ; Daharsh, Ross ; Kise, John ; McComb, Terry ; Hanique, Ernst ; Britton, Jeffrey ; Molden, Arthur ; Holst, Barry ; Coffeen, Larry ; McQuin, Nigel ; Nichols, Dave ; Dufield, Dana ; Newnam, Randy ; Schneider, Herman ; Fitzpat
Volume :
2
fYear :
2001
fDate :
2-2 Nov. 2001
Firstpage :
1064
Lastpage :
1069
Keywords :
Atmospheric measurements; Contamination; Dielectric loss measurement; Dielectric losses; Dielectric measurements; IEC standards; Measurement standards; Pollution measurement; Testing; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Transmission and Distribution Conference and Exposition, 2001 IEEE/PES
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-7285-9
Type :
conf
DOI :
10.1109/TDC.2001.971399
Filename :
971399
Link To Document :
بازگشت