• DocumentCode
    2010849
  • Title

    ReVIVaL: A Variation-Tolerant Architecture Using Voltage Interpolation and Variable Latency

  • Author

    Liang, Xiaoyao ; Wei, Gu-Yeon ; Brooks, David

  • Author_Institution
    Sch. of Eng. & Appl. Sci., Harvard Univ., Cambridge, MA
  • fYear
    2008
  • fDate
    21-25 June 2008
  • Firstpage
    191
  • Lastpage
    202
  • Abstract
    Process variations are poised to significantly degrade performance benefits sought by moving to the next nanoscale technology node. Parameter fluctuations in devices can introduce large variations in peak operation among chips, among cores on a single chip, and among microarchitectural blocks within one core. Hence, it will be difficult to only rely on traditional frequency binning to efficiently cover the large variations that are expected. Furthermore, multiple voltage/frequency domains introduce significant hardware overhead and alone cannot address the full extent of delay variations expected in future multi-core systems. In this paper, we present ReVIVaL, which combines two fine-grained post-fabrication tuning techniques---voltage interpolation(VI) and variable latency(VL). We show that the frequency variation between chips, between cores on one chip, and between functional units within cores can be reduced to a very small range. The effectiveness of these techniques are further verified through experiments on test chips fabricated in a 130 nm CMOS process. Detailed architectural simulations of multi-core processors demonstrate significant performance and power advantages are possible by combining variable latency with voltage interpolation.
  • Keywords
    CMOS digital integrated circuits; interpolation; logic design; CMOS process; ReVIVaL; delay variations; microarchitectural blocks; multicore systems; post-fabrication tuning techniques; process variations; variable latency; variation-tolerant architecture; voltage interpolation; Degradation; Delay; Fluctuations; Frequency domain analysis; Hardware; Interpolation; Microarchitecture; Testing; Tuning; Voltage; Chip Multiprocessor; Microarchitecture; Process Variations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Architecture, 2008. ISCA '08. 35th International Symposium on
  • Conference_Location
    Beijing
  • ISSN
    1063-6897
  • Print_ISBN
    978-0-7695-3174-8
  • Type

    conf

  • DOI
    10.1109/ISCA.2008.27
  • Filename
    4556726