• DocumentCode
    2011064
  • Title

    ChipPower: an architecture-level leakage simulator

  • Author

    Tsai, Yuh-Fang ; Ankadi, Ananth Hegde ; Vijaykrishnan, N. ; Irwin, Mary Jane ; Theocharides, Theo

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Penn State Univ., University Park, PA, USA
  • fYear
    2004
  • fDate
    12-15 Sept. 2004
  • Firstpage
    395
  • Lastpage
    398
  • Abstract
    Leakage power is projected to be one of the major challenges in future technology generations. The temperature profile, process variation, and transistor count all have strong impact on the leakage power distribution of a processor. We have built a simulator to estimate the dynamic/leakage power for a VLIW architecture considering dynamic temperature feedback and process variation. The framework is based on architecture similar to the Intel Itanium IA64 and is extended to simulate its power when implemented in 65nm technology. Our experimental results show that leakage power will become more than 50% of the power budget in 65nm technology. Moreover, without including the process variation, the total leakage power will be underestimated by as much as 30%.
  • Keywords
    circuit simulation; integrated circuit design; leakage currents; microprocessor chips; parallel architectures; 65 nm; ChipPower; Intel Itanium IA64; VLIW architecture; architecture-level leakage simulator; dynamic temperature feedback; leakage power distribution; process variation; processor; temperature profile; transistor count; Clocks; Computational modeling; Computer science; Feedback; Gate leakage; Power generation; Subthreshold current; Temperature; Thermal management; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOC Conference, 2004. Proceedings. IEEE International
  • Print_ISBN
    0-7803-8445-8
  • Type

    conf

  • DOI
    10.1109/SOCC.2004.1362476
  • Filename
    1362476