DocumentCode :
2011064
Title :
ChipPower: an architecture-level leakage simulator
Author :
Tsai, Yuh-Fang ; Ankadi, Ananth Hegde ; Vijaykrishnan, N. ; Irwin, Mary Jane ; Theocharides, Theo
Author_Institution :
Dept. of Comput. Sci. & Eng., Penn State Univ., University Park, PA, USA
fYear :
2004
fDate :
12-15 Sept. 2004
Firstpage :
395
Lastpage :
398
Abstract :
Leakage power is projected to be one of the major challenges in future technology generations. The temperature profile, process variation, and transistor count all have strong impact on the leakage power distribution of a processor. We have built a simulator to estimate the dynamic/leakage power for a VLIW architecture considering dynamic temperature feedback and process variation. The framework is based on architecture similar to the Intel Itanium IA64 and is extended to simulate its power when implemented in 65nm technology. Our experimental results show that leakage power will become more than 50% of the power budget in 65nm technology. Moreover, without including the process variation, the total leakage power will be underestimated by as much as 30%.
Keywords :
circuit simulation; integrated circuit design; leakage currents; microprocessor chips; parallel architectures; 65 nm; ChipPower; Intel Itanium IA64; VLIW architecture; architecture-level leakage simulator; dynamic temperature feedback; leakage power distribution; process variation; processor; temperature profile; transistor count; Clocks; Computational modeling; Computer science; Feedback; Gate leakage; Power generation; Subthreshold current; Temperature; Thermal management; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOC Conference, 2004. Proceedings. IEEE International
Print_ISBN :
0-7803-8445-8
Type :
conf
DOI :
10.1109/SOCC.2004.1362476
Filename :
1362476
Link To Document :
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