DocumentCode :
2011107
Title :
VLSI testing based security metric for IC camouflaging
Author :
Rajendran, Jeyavijayan ; Sinanoglu, Ozgur ; Karri, Ramesh
Author_Institution :
New York Univ., Abu Dhabi, United Arab Emirates
fYear :
2013
fDate :
6-13 Sept. 2013
Firstpage :
1
Lastpage :
4
Abstract :
An Integrated Circuit (IC) can be reverse engineered by imaging its layout and reconstructing the netlist. IC camouflaging is a layout-level technique that hampers imaging-based reverse engineering by using, in one embodiment, functionally different standard cells that look alike. Reverse engineering will fail if the functionality of a camouflaged gate cannot be correctly resolved. We adapt VLSI testing principles (justification and sensitization) to quantify the ability of a reverse engineer to unambiguously resolve the functionality of look-alike camouflaged gates. We evaluate the security of look-alike standard cells based IC camouflaging by applying it on the controllers in OpenSPARC T1 processor.
Keywords :
VLSI; integrated circuit layout; integrated circuit testing; reverse engineering; IC camouflaging; OpenSPARC T1 processor; VLSI testing based security metric; camouflaged gate; integrated circuit; layout-level technique; reverse engineering; Force; Integrated circuits; Layout; Logic gates; Metals; Reverse engineering; Standards;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference (ITC), 2013 IEEE International
Conference_Location :
Anaheim, CA
ISSN :
1089-3539
Type :
conf
DOI :
10.1109/TEST.2013.6651879
Filename :
6651879
Link To Document :
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