DocumentCode :
2011386
Title :
FITVS: A FPGA-Based Emulation Tool For High-Efficiency Hardness Evaluation
Author :
Zheng, Hongchao ; Fan, Long ; Yue, Suge
Author_Institution :
Beijing Microelectron. Technol. Inst., Beijing, China
fYear :
2008
fDate :
10-12 Dec. 2008
Firstpage :
525
Lastpage :
531
Abstract :
This paper presents an improved tool called FITVS (Fault Injection Tool for Validating SEE) using the FPGA-based emulation system for fault grading. A novel library-replace-modeling technique that can quickly and easily perform SEE by injecting faults into the circuit nodes is proposed. It helps IC designers to enhance the quality of their design by providing the sensitivity information of all nodes. Also the fault injection effectiveness is improved with relative to the traditional methods by utilizing C# program and FPGA emulation, and the speed of injection can reach the order of lus/fault.
Keywords :
C++ language; electronic design automation; field programmable gate arrays; integrated circuit reliability; C# program; FITVS; FPGA-based emulation tool; IC design; fault grading; fault injection tool for validating SEE; hardness evaluation; library-replace-modeling technique; single-event-effects; Automatic control; Circuit faults; Circuit simulation; Distributed processing; Emulation; Field programmable gate arrays; Hardware design languages; Libraries; Logic circuits; Very large scale integration; FPGA-based emulation; Fault Injection; Fault/Error Models; SEE;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Parallel and Distributed Processing with Applications, 2008. ISPA '08. International Symposium on
Conference_Location :
Sydney, NSW
Print_ISBN :
978-0-7695-3471-8
Type :
conf
DOI :
10.1109/ISPA.2008.46
Filename :
4725189
Link To Document :
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