Title :
Broadband analysis and characterization of anisotropic dielectric temperature dependence
Author :
Rautio, Brian J. ; El Sabbagh, Mahmoud ; Rautio, James C.
Author_Institution :
L.C. Smith Coll. of Eng. & Comput. Sci., Syracuse Univ., Syracuse, NY, USA
Abstract :
A broadband methodology for measurement of uniaxial dielectric anisotropy is described. Previous work is improved with reduced measurement error, enhanced automation, and additional material testing. Additionally, permittivity variation with temperature is explored.
Keywords :
enhanced magnetoresistance; measurement errors; permittivity measurement; anisotropic dielectric temperature dependence; broadband analysis; material testing; measurement error; permittivity variation; uniaxial dielectric anisotropy; Materials; Permittivity; Permittivity measurement; Pollution measurement; Semiconductor device measurement; Temperature measurement; Anisotropy; dielectric material; dispersion; permittivity; temperature dependence;
Conference_Titel :
Ultra-Wideband (ICUWB), 2011 IEEE International Conference on
Conference_Location :
Bologna
Print_ISBN :
978-1-4577-1763-5
Electronic_ISBN :
2162-6588
DOI :
10.1109/ICUWB.2011.6058904
