DocumentCode :
2011488
Title :
Trench j-MOS power field-effect transistors
Author :
Jain, Kailash C. ; MacIver, Bernard A. ; Valeri, Stephen J. ; Erskine, James C. ; Bulucea, Constantin
Author_Institution :
General Motors Res. Lab., Warren, MI, USA
fYear :
1989
fDate :
28-29 Aug 1989
Firstpage :
3
Lastpage :
8
Abstract :
A normally-on MOSFET structure called j-MOS for automotive electronic systems applications is discussed. These devices are built on silicon-on-insulator (SOI) and in bulk silicon and can be integrated as a smart power circuit element. The lowest on-resistance j-MOS device is built in an ideal trench configuration in bulk silicon and can be operated in either a three-terminal or a four-terminal mode. When operated in accumulation, a specific on-resistance of 0.8 mΩcm2 is reported. This low on-resistance is attributed to the combination of bulk conduction and surface accumulation, as well as to the details of the electron current flow in the channel. A factor of two superiority is reported in on-resistance over a trench DMOS structure for a given drain blocking voltage and feature size. In the four-terminal mode, a high transconductance, 290 S/cm2, is achieved by controlling the voltage on the small junction in the gate. In the three-terminal mode, mixed pentode-triode drain characteristics are exhibited. Response times are comparable to those of a junction FET. This simple self-aligned structure could be useful in power switching and control applications
Keywords :
automotive electronics; insulated gate field effect transistors; power transistors; automotive electronic systems; bulk conduction; drain blocking voltage; electron current flow; on-resistance; pentode-triode drain characteristics; power switching; self-aligned structure; smart power circuit element; surface accumulation; transconductance; trench j-MOS power FET; Automotive engineering; Delay; FETs; Fabrication; Laboratories; P-n junctions; Power system reliability; Silicon; Surface resistance; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Automotive Power Electronics, 1989
Conference_Location :
Dearborn, MI
Type :
conf
DOI :
10.1109/APE.1989.97147
Filename :
97147
Link To Document :
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