DocumentCode :
2011583
Title :
[Front cover]
fYear :
2009
fDate :
11-12 May 2009
Abstract :
The following topics were dealt with: imaging sensors; electrical tomography systems; medical imaging systems; biometrics; tomographic image analysis; millimeter and microwave imaging; calibration techniques; optical imaging; image recognition; feature extraction; industrial tomography imaging and image algorithms.
Keywords :
biomedical imaging; biometrics (access control); calibration; electric impedance imaging; feature extraction; image recognition; image sensors; industrial engineering; microwave imaging; millimetre wave imaging; optical images; tomography; biometrics; calibration technique; electrical tomography system; feature extraction; image algorithm; image recognition; imaging sensor; industrial tomography imaging; medical imaging system; microwave imaging; millimeter imaging; optical imaging; tomographic image analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Imaging Systems and Techniques, 2009. IST '09. IEEE International Workshop on
Conference_Location :
Shenzhen
Print_ISBN :
978-1-4244-3482-4
Type :
conf
DOI :
10.1109/IST.2009.5071586
Filename :
5071586
Link To Document :
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