• DocumentCode
    2011591
  • Title

    An optimal replacement policy for cooling of 3D stacked mesh array

  • Author

    Inoguchi, Yasushi ; Matsuzawa, Teruo ; Horiguchi, Susumu

  • Author_Institution
    Center for Inf. Sci., Japan Adv. Inst. of Sci. & Technol., Ishikawa, Japan
  • Volume
    2
  • fYear
    2000
  • fDate
    14-17 May 2000
  • Firstpage
    1087
  • Abstract
    This paper addresses reconfigurations and the cooling of a 3D stacked mesh array by considering thermo-radiation. We propose a heuristic replacement policy to avoid defects on a wafer by moving hot processing elements (PEs) toward edge of the wafer to cool efficiently. Introducing a thermo-radiation model for the 3D stacked complex, the reconfiguration performance and thermo-radiation of the 3D stacked mesh array are evaluated. Three cooling schemes are proposed and evaluated. The placement of spare PEs, moving hot PEs and heuristic replacement are discussed from the viewpoint of system yield and cooling performance. The heuristic replacement policy uses a repeating reconfiguration procedure, and estimates the cooling efficiency based on the thermo-radiation model for each possible replacement, then the policy adopts the best replacement. Comparing system yields and maximum temperatures by thermo-radiation simulations on a Cray-T3E supercomputer, these cooling approaches maintain the 3D stacked mesh array at a lower temperature while keeping system yield high.
  • Keywords
    chip-on-board packaging; circuit layout CAD; circuit simulation; cooling; logic arrays; parallel machines; printed circuit layout; 3D stacked mesh array; Cray-T3E supercomputer; cooling; cooling performance; heuristic replacement policy; hot processing elements; optimal replacement policy; reconfigurations; system yield; thermo-radiation; thermo-radiation simulations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Performance Computing in the Asia-Pacific Region, 2000. Proceedings. The Fourth International Conference/Exhibition on
  • Conference_Location
    Beijing, China
  • Print_ISBN
    0-7695-0589-2
  • Type

    conf

  • DOI
    10.1109/HPC.2000.843607
  • Filename
    843607