DocumentCode
2011702
Title
Don´t forget to lock your SIB: Hiding instruments using P16871
Author
Dworak, Jennifer ; Crouch, Andrew ; Potter, John ; Zygmontowicz, Adam ; Thornton, Mitchell
Author_Institution
Southern Methodist Univ., Dallas, TX, USA
fYear
2013
fDate
6-13 Sept. 2013
Firstpage
1
Lastpage
10
Abstract
IEEE P1687 is a valuable tool for accessing on-chip instruments during test, diagnosis, debug, and board configuration. However, most of these instruments should not be available to an end user in the field. We propose a method for hiding instruments in a P1687 network that utilizes a “locking” segment insertion bit (LSIB) that can only be opened when pre-defined values, corresponding to a key, are present in particular bits in the chain. We also introduce “trap” bits, which can further reduce the effectiveness of brute force attacks by permanently locking an LSIB when an incorrect value is written to the trap´s update register. Only a global reset will allow the LSIB to become operable again. In this paper, we investigate the cost and effectiveness of LSIBs and traps in several different configurations and show that these relatively small modifications to the P1687 network can make undocumented instrument access exceedingly difficult.
Keywords
built-in self test; integrated circuit testing; IC test; IEEE P1687 network; SIB; built-in-self-test; hiding instruments; locking segment insertion bit; on-chip instruments; trap bits; Computer architecture; Hardware; Instruments; Microprocessors; Registers; Security; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference (ITC), 2013 IEEE International
Conference_Location
Anaheim, CA
ISSN
1089-3539
Type
conf
DOI
10.1109/TEST.2013.6651903
Filename
6651903
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