• DocumentCode
    2011702
  • Title

    Don´t forget to lock your SIB: Hiding instruments using P16871

  • Author

    Dworak, Jennifer ; Crouch, Andrew ; Potter, John ; Zygmontowicz, Adam ; Thornton, Mitchell

  • Author_Institution
    Southern Methodist Univ., Dallas, TX, USA
  • fYear
    2013
  • fDate
    6-13 Sept. 2013
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    IEEE P1687 is a valuable tool for accessing on-chip instruments during test, diagnosis, debug, and board configuration. However, most of these instruments should not be available to an end user in the field. We propose a method for hiding instruments in a P1687 network that utilizes a “locking” segment insertion bit (LSIB) that can only be opened when pre-defined values, corresponding to a key, are present in particular bits in the chain. We also introduce “trap” bits, which can further reduce the effectiveness of brute force attacks by permanently locking an LSIB when an incorrect value is written to the trap´s update register. Only a global reset will allow the LSIB to become operable again. In this paper, we investigate the cost and effectiveness of LSIBs and traps in several different configurations and show that these relatively small modifications to the P1687 network can make undocumented instrument access exceedingly difficult.
  • Keywords
    built-in self test; integrated circuit testing; IC test; IEEE P1687 network; SIB; built-in-self-test; hiding instruments; locking segment insertion bit; on-chip instruments; trap bits; Computer architecture; Hardware; Instruments; Microprocessors; Registers; Security; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2013 IEEE International
  • Conference_Location
    Anaheim, CA
  • ISSN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2013.6651903
  • Filename
    6651903