• DocumentCode
    2011944
  • Title

    Heterogeneous integration of vaporliquidsolid grown silicon microprobe arrays/(111) and MOSFETs/(100) using a silicon on insulator substrate

  • Author

    Okugawa, Akihiro ; Mayumi, Kotaro ; Kawano, Takeshi ; Ishida, Makoto

  • Author_Institution
    Toyohashi Univ. of Technol., Toyohashi, Japan
  • fYear
    2010
  • fDate
    24-28 Jan. 2010
  • Firstpage
    372
  • Lastpage
    375
  • Abstract
    Herein we report heterogeneous integration of vertically-aligned silicon (Si) microprobe arrays/(111) with MOSFET circuits/(100) by IC processes and subsequent selective vapor-liquid-solid (VLS) growth of silicon. A hybrid silicon-on-insulator (SOI) substrate with a (100) topSi/buried oxide (BOX)/(111) handle-Si system was utilized for the integration technique. MOSFETs were fabricated on (100) topSi, and VLS-Si probe arrays were assembled at the exposed (111) handle-Si wafer where the (100) top-Si region was removed by anisotropic etching. The different Si layers of the MOSFETs and probes were electrically connected by a 3D metallization technique. Additionally, we investigated the electrical properties of 3D metallization and the MOSFETs. The results indicate potential for heterogeneous integration of VLS probes/(111) and MOSFETs/(100). The proposed technique also promises further integrations of numerous microdevices/different species of substrates and microelectronics/(100) on the same chip.
  • Keywords
    MOSFET circuits; etching; microassembling; semiconductor device metallisation; semiconductor growth; silicon; silicon-on-insulator; 3D metallization; IC process; MOSFET circuit; Si; VLS probes; anisotropic etching; assembly; buried oxide; electrical property; handle-Si wafer; heterogeneous integration; silicon on insulator substrate; top-Si region; vapor-liquid-solid grown silicon microprobe arrays; Chemical sensors; Electron traps; Etching; MOSFETs; Metallization; Microelectronics; Nanoelectromechanical systems; Probes; Silicon on insulator technology; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems (MEMS), 2010 IEEE 23rd International Conference on
  • Conference_Location
    Wanchai, Hong Kong
  • ISSN
    1084-6999
  • Print_ISBN
    978-1-4244-5761-8
  • Electronic_ISBN
    1084-6999
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2010.5442489
  • Filename
    5442489