Title :
On the generation of compact test sets
Author :
Kumar, Ajit ; Rajski, J. ; Reddy, S.M. ; Chen Wang
Author_Institution :
Dept. of ECE, Univ. of Iowa, Iowa City, IA, USA
Abstract :
New methods are proposed to guide line justification and fault propagation in test generation procedures to derive compact test sets. Experiments on several industrial designs yielded, on average, 24% reduction in test set sizes.
Keywords :
VLSI; automatic test pattern generation; fault diagnosis; VLSI designs; compact test sets; fault propagation; industrial designs; line justification; test generation procedures; Automatic test pattern generation; Circuit faults; Compaction; Controllability; Logic gates; Observability; System-on-chip;
Conference_Titel :
Test Conference (ITC), 2013 IEEE International
Conference_Location :
Anaheim, CA
DOI :
10.1109/TEST.2013.6651914
