• DocumentCode
    2011969
  • Title

    On the generation of compact test sets

  • Author

    Kumar, Ajit ; Rajski, J. ; Reddy, S.M. ; Chen Wang

  • Author_Institution
    Dept. of ECE, Univ. of Iowa, Iowa City, IA, USA
  • fYear
    2013
  • fDate
    6-13 Sept. 2013
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    New methods are proposed to guide line justification and fault propagation in test generation procedures to derive compact test sets. Experiments on several industrial designs yielded, on average, 24% reduction in test set sizes.
  • Keywords
    VLSI; automatic test pattern generation; fault diagnosis; VLSI designs; compact test sets; fault propagation; industrial designs; line justification; test generation procedures; Automatic test pattern generation; Circuit faults; Compaction; Controllability; Logic gates; Observability; System-on-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2013 IEEE International
  • Conference_Location
    Anaheim, CA
  • ISSN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2013.6651914
  • Filename
    6651914
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2011969