Title :
Proceedings 2000 IEEE International Workshop on Defect Based Testing (Cat. No.PR00637)
Abstract :
The following topics were covered: deep submicron IDDQ testing; defect-oriented testing; current measurement and yield; current and voltage test techniques
Keywords :
CMOS integrated circuits; VLSI; electric current measurement; fault diagnosis; integrated circuit testing; integrated circuit yield; logic testing; voltage measurement; CMOS ICs; IC yield; current measurement; current test techniques; deep submicron IDDQ testing; defect-oriented testing; voltage test techniques;
Conference_Titel :
Defect Based Testing, 2000. Proceedings. 2000 IEEE International Workshop on
Conference_Location :
Montreal, Quebec, Canada
Print_ISBN :
0-7695-0637-2
DOI :
10.1109/DBT.2000.843682
