Title :
FPGA-based universal embedded digital instrument
Author_Institution :
ATE Oper. - NPI Enabling Technol., Teradyne, Inc., North Reading, MA, USA
Abstract :
In order to test products, a multi-purpose digital instrument has been developed which can be completely embedded within on-board FPGAs. This instrument incorporates numerous features such as specialized triggering, fault capture, and pattern edge placement. To increase usability, pattern generation and protocol-aware features are included within its small footprint. The applications of the embedded instrument can include design verification, production test, and fault diagnostics in a simple and low resource implementation.
Keywords :
automatic test equipment; digital instrumentation; fault diagnosis; fault location; field programmable gate arrays; production testing; design verification; fault capture; fault diagnostics; field programmable gate array; intellectual property core; multipurpose digital instrument; on-board FPGA; pattern edge placement; pattern generation; production test; protocol-aware features; specialized triggering; universal embedded digital instrument; Clocks; Field programmable gate arrays; Generators; Instruments; Random access memory; Testing; Vectors;
Conference_Titel :
Test Conference (ITC), 2013 IEEE International
Conference_Location :
Anaheim, CA
DOI :
10.1109/TEST.2013.6651917
