Title :
Defect-based testing for fabless companies
Author :
Khare, J. ; Heubeken, H.T.
Author_Institution :
Level One Commun., Sacramento, CA, USA
Abstract :
This paper describes the importance of defect-based testing and diagnostics for fabless semiconductor companies. The examples in the paper show that defect statistics obtained from defect-based testing can be used by fabless companies to optimize their designs for a target foundry thereby significantly reducing die cost and improving profit margin. The paper also describes a defect parameter extraction system based on defect-based testing
Keywords :
VLSI; fault diagnosis; integrated circuit testing; statistical analysis; defect parameter extraction system; defect statistics; defect-based testing; die cost; fabless companies; fault diagnostics; profit margin; target foundry; Cost function; Design optimization; Electronics industry; Foundries; Fuels; Graphics; IP networks; Semiconductor device testing; Statistical analysis; System testing;
Conference_Titel :
Defect Based Testing, 2000. Proceedings. 2000 IEEE International Workshop on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7695-0637-2
DOI :
10.1109/DBT.2000.843686
