• DocumentCode
    2012066
  • Title

    A high-speed batch-mode ultrasonic machining technology for multi-level quartz crystal microstructures

  • Author

    Li, Tao ; Gianchandani, Yogesh B.

  • Author_Institution
    Eng. Res. Center for Wireless Integrated Microsyst., Univ. of Michigan, Ann Arbor, MI, USA
  • fYear
    2010
  • fDate
    24-28 Jan. 2010
  • Firstpage
    348
  • Lastpage
    351
  • Abstract
    This paper describes recent advances in batch-mode micro ultrasonic machining (¿USM) and its application to quartz crystal (QC) microstructures. Acoustic emission sensors are used for close monitoring of this batch process. Multi-level AT-cut QC microstructures have been successfully fabricated at a cutting rate >24 ¿m/min, which is substantially faster than available options for plasma-based etching. Arrays of disks, H-shaped and tuning fork structures are demonstrated with a cutting depth up to ~105 ¿m on the 110 ¿m-thick QC substrate. Micromachined QC structures are also mounted on interconnection substrates. Preliminary electrical tests have been performed for resonance characteristics. A low-thermal-expansion glass ceramic, ZERODUR®, has also been micromachined at a cutting rate >18 ¿m/min.
  • Keywords
    acoustic emission; acoustic transducers; crystal microstructure; microfabrication; micromachining; quartz; sputter etching; ultrasonic machining; H-shaped structures; acoustic emission sensors; disk array; electrical tests; high-speed batch-mode ultrasonic machining technology; interconnection substrates; low-thermal-expansion glass ceramic; multilevel AT-cut QC microstructures; multilevel quartz crystal microstructures; plasma-based etching; size 110 mum; tuning fork structures; Acoustic emission; Acoustic sensors; Crystal microstructure; Etching; Machining; Monitoring; Plasma applications; Plasma properties; Testing; Vibrations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems (MEMS), 2010 IEEE 23rd International Conference on
  • Conference_Location
    Wanchai, Hong Kong
  • ISSN
    1084-6999
  • Print_ISBN
    978-1-4244-5761-8
  • Electronic_ISBN
    1084-6999
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2010.5442495
  • Filename
    5442495