DocumentCode :
2012066
Title :
A high-speed batch-mode ultrasonic machining technology for multi-level quartz crystal microstructures
Author :
Li, Tao ; Gianchandani, Yogesh B.
Author_Institution :
Eng. Res. Center for Wireless Integrated Microsyst., Univ. of Michigan, Ann Arbor, MI, USA
fYear :
2010
fDate :
24-28 Jan. 2010
Firstpage :
348
Lastpage :
351
Abstract :
This paper describes recent advances in batch-mode micro ultrasonic machining (¿USM) and its application to quartz crystal (QC) microstructures. Acoustic emission sensors are used for close monitoring of this batch process. Multi-level AT-cut QC microstructures have been successfully fabricated at a cutting rate >24 ¿m/min, which is substantially faster than available options for plasma-based etching. Arrays of disks, H-shaped and tuning fork structures are demonstrated with a cutting depth up to ~105 ¿m on the 110 ¿m-thick QC substrate. Micromachined QC structures are also mounted on interconnection substrates. Preliminary electrical tests have been performed for resonance characteristics. A low-thermal-expansion glass ceramic, ZERODUR®, has also been micromachined at a cutting rate >18 ¿m/min.
Keywords :
acoustic emission; acoustic transducers; crystal microstructure; microfabrication; micromachining; quartz; sputter etching; ultrasonic machining; H-shaped structures; acoustic emission sensors; disk array; electrical tests; high-speed batch-mode ultrasonic machining technology; interconnection substrates; low-thermal-expansion glass ceramic; multilevel AT-cut QC microstructures; multilevel quartz crystal microstructures; plasma-based etching; size 110 mum; tuning fork structures; Acoustic emission; Acoustic sensors; Crystal microstructure; Etching; Machining; Monitoring; Plasma applications; Plasma properties; Testing; Vibrations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2010 IEEE 23rd International Conference on
Conference_Location :
Wanchai, Hong Kong
ISSN :
1084-6999
Print_ISBN :
978-1-4244-5761-8
Electronic_ISBN :
1084-6999
Type :
conf
DOI :
10.1109/MEMSYS.2010.5442495
Filename :
5442495
Link To Document :
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