Title :
A practical implementation of BICS for safety-critical applications
Author :
Smith, Patricia A. ; Campbell, David V.
Author_Institution :
Digital Microelectron. Dept., Sandia Nat. Labs., Albuquerque, NM, USA
Abstract :
This paper presents the challenges and solutions of applying Built-In-Current Sensors (BICS) to a safety-critical IC design for the purpose of in-situ state-of-health monitoring. The developed Quiescent Current Monitor (QCM) system consists of multiple BICS and digital control logic. The QCM BICS can detect leakage current as low as 4 μA, run at system speed, and has relatively low real estate overhead. The QCM digital logic incorporates extensive debug capability and Built-ln-Self-Test (BIST). We performed analog and digital simulations of the integrated BICS, and performed layout and tape-out of the design. Silicon is now in fabrication. Results to date show that, for some systems, BICS can be a practical and relatively inexpensive method for providing state-of-health monitoring of safety-critical microelectronics
Keywords :
CMOS integrated circuits; built-in self test; condition monitoring; digital control; electric current measurement; electric sensing devices; integrated circuit design; integrated circuit reliability; integrated circuit testing; leakage currents; mixed analogue-digital integrated circuits; safety; timing; 0.6 micron; BIST; built-in-current sensors; built-in-self-test; debug capability; digital control logic; in-situ state-of-health monitoring; integrated BICS; leakage current detection; quiescent current monitor system; safety-critical IC design; safety-critical applications; safety-critical microelectronics; Built-in self-test; Digital control; Digital simulation; Fabrication; Leak detection; Leakage current; Logic; Microelectronics; Monitoring; Silicon;
Conference_Titel :
Defect Based Testing, 2000. Proceedings. 2000 IEEE International Workshop on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7695-0637-2
DOI :
10.1109/DBT.2000.843690
