Title :
BA-BIST: Board test from inside the IC out
Author :
Conroy, Zoe ; Crouch, Andrew
Author_Institution :
Cisco Syst. Inc., San Jose, CA, USA
Abstract :
With shrinking geometries of PCBs, increasing interface speeds and corresponding loss of test point access to diagnose structural test defects, new standard test mechanisms are needed to test chip-to-chip connectivity and functionality at the board level. New requirements for an integrated circuit `BA´ (Board-Assist) BIST to structurally test these interfaces will be presented. A standardized BA-BIST template and algorithms for industry leverage are proposed.
Keywords :
built-in self test; integrated circuit testing; printed circuit testing; BA-BIST algorithms; BA-BIST standardization template; IC interfaces; board level functionality; board-assist build-in self test; chip-to-chip connectivity test; interface speeds; Barium; Built-in self-test; Industries; Integrated circuits; Manufacturing; Random access memory; Standardization;
Conference_Titel :
Test Conference (ITC), 2013 IEEE International
Conference_Location :
Anaheim, CA
DOI :
10.1109/TEST.2013.6651919
