DocumentCode :
2012102
Title :
Batch fabrication of scanning microscopy probes for thermal and magnetic imaging using standard micromachining
Author :
Sarajlic, E. ; Vermeer, R. ; Delalande, M.Y. ; Siekman, M.H. ; Huijink, R. ; Fujita, H. ; Abelmann, L.
Author_Institution :
SmartTip B.V., Netherlands
fYear :
2010
fDate :
24-28 Jan. 2010
Firstpage :
328
Lastpage :
331
Abstract :
We present a process for batch fabrication of a novel scanning microscopy probe for thermal and magnetic imaging using standard micromachining and conventional optical contact lithography. The probe features an AFM-type cantilever with a sharp pyramidal tip composed of four freestanding silicon nitride nanowires coated by conductive material. The nanowires form an electrical cross junction at the apex of the tip, addressable through the electrodes integrated on the cantilever. The cross junction on the tip apex can be utilized to produce heat and detect local temperature changes or to serve as a miniaturized Hall magnetometer enabling, in principle, thermal and magnetic imaging by scanning the probe tip over a surface. We have successfully fabricated a first probe prototype with a nanowire tip composed of 140 nm thick and 11 ¿m long silicon nitride wires metallized by 6 nm titan and 30 nm gold layers. We have experimentally characterized electrical and thermal properties of the probe demonstrating its proper functioning.
Keywords :
atomic force microscopy; infrared imaging; magnetometers; microfabrication; micromachining; nanowires; scanning probe microscopy; AFM-type cantilever; batch fabrication; conductive material; electrical cross junction; magnetic imaging; nanowires; optical contact lithography; scanning microscopy probes; silicon nitride nanowires; size 11 mum; size 140 nm; size 30 nm; standard micromachining; thermal imaging; thermal-magnetic imaging; Atomic force microscopy; Contacts; Magnetic force microscopy; Micromachining; Nanowires; Optical device fabrication; Optical imaging; Optical microscopy; Probes; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2010 IEEE 23rd International Conference on
Conference_Location :
Wanchai, Hong Kong
ISSN :
1084-6999
Print_ISBN :
978-1-4244-5761-8
Electronic_ISBN :
1084-6999
Type :
conf
DOI :
10.1109/MEMSYS.2010.5442498
Filename :
5442498
Link To Document :
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