Title :
Reliability Assurance And Qualification of High-reliability Lasers And Laser Packages
Author :
Dean, B.A. ; Nash, F.R. ; Eltringhani, T.F. ; Ku, R.T.
Author_Institution :
AT&T Bell Laboratories
Keywords :
Aging; Certification; Degradation; Fiber lasers; Laser modes; Optical fibers; Packaging; Qualifications; Semiconductor lasers; Testing;
Conference_Titel :
LEOS '92, Conference Proceedings. IEEE Lasers and Electro-Optics Society, 1992 Annual Meeting
Print_ISBN :
0-7803-0526-4
DOI :
10.1109/LEOS.1992.693934
