• DocumentCode
    2012156
  • Title

    3D object shape and reflectance property reconstruction using image scanner

  • Author

    Ukida, Hiroyuki ; Tanimoto, Yoshio ; Sano, Tetsuya ; Yamamoto, Hideki

  • Author_Institution
    Fac. of Eng., Univ. of Tokushima, Tokushima
  • fYear
    2009
  • fDate
    11-12 May 2009
  • Firstpage
    94
  • Lastpage
    99
  • Abstract
    This study proposes a method to recover 3D shape, color and specular reflections of an object from images taken by an image scanner which has multiple illuminations. The proposed method is constructed by two processes. First is the initial shape estimation and second is the iterative process to estimate the object shape, color and specular components. In this paper, we propose two methods for the initial shape estimation: one is the use of multiple light sources along circular paths and the other is the use of two groups of two light sources located in same direction. From the experimental results using synthetic images, multiple light sources can be estimate object shape, color and specular reflections correctly. But, because of many light sources, the structure of the image scanner will be complex. On the other hand, in case of two groups of two light sources, estimated object color and specular components has some errors but the object shape can be estimated accurately.
  • Keywords
    image colour analysis; image reconstruction; image scanners; lighting; reflectivity; 3D object shape; image scanner; iterative process; light sources; multiple illuminations; multiple light sources; reflectance property reconstruction; shape estimation; specular reflections; synthetic images; Color; Image reconstruction; Light sources; Lighting; Manufacturing; Optical reflection; Photometry; Reflectivity; Shape; Systems engineering education; 3D shape reconstruction; image scanner; multiple light sources; photometric stereo; specular reflections;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Imaging Systems and Techniques, 2009. IST '09. IEEE International Workshop on
  • Conference_Location
    Shenzhen
  • Print_ISBN
    978-1-4244-3482-4
  • Electronic_ISBN
    978-1-4244-3483-1
  • Type

    conf

  • DOI
    10.1109/IST.2009.5071610
  • Filename
    5071610