DocumentCode :
2012159
Title :
Author index
fYear :
2000
fDate :
30-30 April 2000
Firstpage :
82
Lastpage :
82
Abstract :
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect Based Testing, 2000. Proceedings. 2000 IEEE International Workshop on
Conference_Location :
Montreal, Que., Canada
Print_ISBN :
0-7695-0637-2
Type :
conf
DOI :
10.1109/DBT.2000.843695
Filename :
843695
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2012159
