DocumentCode :
2012162
Title :
In-system diagnosis of RF ICs for tolerance against on-chip in-band interferers
Author :
Azuma, N. ; Makita, Tetsuya ; Ueyama, Satoshi ; Nagata, M. ; Takahashi, Satoshi ; Murakami, M. ; Hori, Kenji ; Tanaka, Shoji ; Yamaguchi, Masaki
Author_Institution :
Grad. Sch. of Syst. Inf., Kobe Univ., Kobe, Japan
fYear :
2013
fDate :
6-13 Sept. 2013
Firstpage :
1
Lastpage :
9
Abstract :
The tolerance of RF ICs against on-chip in-band interferers is diagnosed from the viewpoints of the quality of wireless channels compliant with LTE standards. The on-chip interferers inevitably propagate from other active circuits like digital backend processors through silicon substrate coupling in the same die of system-level integration. An in-system diagnosis platform of RF ICs presented in this paper relates the impacts of such interferers on the circuit-level response and system-level communication performance metrics. The figures of communication quality at a system level, like EVM, BER and throughput are concurrently evaluated with the strengths of interferers in different forms and at different locations in a silicon chip. The interferers are measured as the in-band signal to spurious power ratio at the output of RF ICs, the magnitude of substrate voltage fluctuations at the proximity of RF ICs, and related with the amount of power current consumed by base-band digital ICs. The tolerance of RF ICs is represented by the maximum strength of on-chip interferers for sustaining prescribed communication performance. The diagnosis system is divided into two parts, (i) a system-level RF simulator handling modulation and demodulation of real communication vectors in LTE format and also enabling hardware connectivity with RF ICs, and (ii) a silicon emulator of on-chip interferers coupled to the RF ICs. A 65 nm CMOS chip incorporates an on-chip arbitrary noise generator, an on-chip waveform capture, and RF IC for LTE receiver front end, and demonstrates the entire diagnosis.
Keywords :
CMOS integrated circuits; Long Term Evolution; radiofrequency integrated circuits; radiofrequency interference; wireless channels; BER; CMOS chip; EVM; LTE receiver front end; LTE standards; RFIC tolerance; active circuits; baseband digital IC; communication quality; communication vector demodulation; communication vector modulation; digital backend processors; in-system diagnosis platform; on-chip arbitrary noise generator; on-chip in-band interferers; on-chip waveform capture; power current; silicon chip; silicon emulator; silicon substrate coupling; size 65 nm; system-level RF simulator; system-level communication performance metrics; system-level integration; wireless channels; Couplings; Noise; Radio frequency; Standards; Substrates; System-on-chip; Wireless communication; on-chip measurements; radio frequency integrated circuits; substrate noise coupling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference (ITC), 2013 IEEE International
Conference_Location :
Anaheim, CA
ISSN :
1089-3539
Type :
conf
DOI :
10.1109/TEST.2013.6651922
Filename :
6651922
Link To Document :
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