• DocumentCode
    2012256
  • Title

    Thermoelectric Properties of NdxCo4-yNiySb12 Skutterudite Compounds

  • Author

    Ros, V. Da ; Lenoir, B. ; Dauscher, A. ; Candolfi, C. ; Bellouard, C. ; Stiewe, C. ; Müller, E. ; Hejtmanek, J.

  • Author_Institution
    Lab. de Phys. des Materiaux, Ecole Nationale Superieure des Mines de Nancy
  • fYear
    2006
  • fDate
    6-10 Aug. 2006
  • Firstpage
    155
  • Lastpage
    158
  • Abstract
    In an effort to further understand the influence of Nd on the thermoelectric properties of the binary compound CoSb3 and try to optimize them through doping, we prepared and investigated NdxCo4-yNiySb12 compounds. The samples have been prepared by a conventional metallurgical route. Structural analysis has been carried out by X-ray diffraction. The chemical composition and micro-homogeneity have been checked by electron probe microanalysis. Measurements of the electrical resistivity, thermoelectric power, thermal conductivity and Hall coefficient have been performed. The influence of both Nd and Ni on the thermoelectric properties of the binary parent CoSb3 is presented and discussed. Nd plays the role of a dopant (n-type) and the presence of Ni contributes to decrease significantly the electrical resistivity
  • Keywords
    Hall effect; X-ray diffraction; cobalt compounds; doping; electrical resistivity; electron probe analysis; narrow band gap semiconductors; neodymium compounds; nickel compounds; powder metallurgy; thermal conductivity; thermoelectric power; Hall coefficient; NdxCo4-yNiySb12; X-ray diffraction; chemical composition; doping; electrical resistivity; electron probe microanalysis; metallurgy; microhomogeneity; skutterudite compound; structural analysis; thermal conductivity; thermoelectric power; thermoelectric property; Chemicals; Conductivity measurement; Doping; Electric resistance; Electrons; Neodymium; Probes; Thermal conductivity; Thermoelectricity; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermoelectrics, 2006. ICT '06. 25th International Conference on
  • Conference_Location
    Vienna
  • ISSN
    1094-2734
  • Print_ISBN
    1-4244-0811-3
  • Electronic_ISBN
    1094-2734
  • Type

    conf

  • DOI
    10.1109/ICT.2006.331322
  • Filename
    4133260