DocumentCode :
2012297
Title :
Design and characteristics measurement of a high-speed CMOS imaging system
Author :
Shang, Yuanyuan ; Guan, Yong ; Zhao, Xiaoxu ; Zhang, Shudong ; Liu, Hui
Author_Institution :
Coll. of Inf. Eng., Capital Normal Univ., Beijing
fYear :
2009
fDate :
11-12 May 2009
Firstpage :
127
Lastpage :
131
Abstract :
This paper introduces the design of a high-speed 2K times 2K CMOS imaging system that is part of a Wide Field Monitor System proposed in China recent years. The CMOS sensor used in this imaging system is LUPA-4000 from Cypress corp. This CMOS camera is composed of an analogue system and a digital embedded system. The digital embedded system integrated with an NIOS II soft-core processor serves as the control and data acquisition system of the camera. In addition, research on characteristics measurement for CMOS imagers was carried out, including readout noise, linearity, quantum efficiency, pixel non-uniformity, dark current, full-well capacity, and gain. The photon transfer technique is adopted to evaluate the gain and readout noise. At last, the evaluation results of the high-speed CMOS imaging system are shown. The results indicate that this high-speed CMOS camera can meet the requirements of the whole Wide Field Monitor System.
Keywords :
CMOS image sensors; data acquisition; high-speed techniques; CMOS sensor; LUPA-4000; NIOS II soft-core processor; Wide Field Monitor System; analogue embedded system; dark current; data acquisition system; digital embedded system; high-speed CMOS imaging system; photon transfer technique; quantum efficiency; CMOS image sensors; Control systems; Current measurement; Data acquisition; Digital cameras; Embedded system; Gain measurement; Monitoring; Sensor phenomena and characterization; Sensor systems; CMOS imager; Full-well capacity; Linearity; Quantum efficiency; Readout noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Imaging Systems and Techniques, 2009. IST '09. IEEE International Workshop on
Conference_Location :
Shenzhen
Print_ISBN :
978-1-4244-3482-4
Electronic_ISBN :
978-1-4244-3483-1
Type :
conf
DOI :
10.1109/IST.2009.5071617
Filename :
5071617
Link To Document :
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