• DocumentCode
    2012306
  • Title

    Impact of Technology Scaling on Digital Subthreshold Circuits

  • Author

    Bol, David ; Ambroise, Renaud ; Flandre, Denis ; Legat, Jean-Didier

  • Author_Institution
    Microelectron. Lab., Univ. catholique de Louvain, Louvain-la-Neuve
  • fYear
    2008
  • fDate
    7-9 April 2008
  • Firstpage
    179
  • Lastpage
    184
  • Abstract
    Subthreshold circuits exhibit ultra-low energy per operation at the expense of increased delay. In this contribution, the impact of technology scaling on digital subthreshold circuits is investigated. Migrating from 0.25-mum to 32-nm node is shown to considerably lower the energy consumption of a subthreshold 8x8-bit RCA multiplier. When reaching the smallest nodes, limitations come from slow scaling of the static energy consumption and the deteriorating static noise margin, which raises robustness issues when considering process variability. These effects result in a loss of energy efficiency. The use of non-minimum channel length is proposed to improve energy efficiency. At 32-nm node, it reduces total energy consumption by a factor 5.
  • Keywords
    circuit noise; digital circuits; low-power electronics; RCA multiplier; digital subthreshold circuits; energy efficiency; nonminimum channel length; static energy consumption; static noise margin; technology scaling; Circuit noise; Delay; Energy consumption; Energy efficiency; MOSFET circuits; Microelectronics; Noise robustness; Predictive models; Throughput; Very large scale integration; CMOS digital circuits; robustness; subthreshold logic; technology scaling; ultra-low power;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Symposium on VLSI, 2008. ISVLSI '08. IEEE Computer Society Annual
  • Conference_Location
    Montpellier
  • Print_ISBN
    978-0-7695-3291-2
  • Electronic_ISBN
    978-0-7695-3170-0
  • Type

    conf

  • DOI
    10.1109/ISVLSI.2008.75
  • Filename
    4556791