Title :
Impact of Technology Scaling on Digital Subthreshold Circuits
Author :
Bol, David ; Ambroise, Renaud ; Flandre, Denis ; Legat, Jean-Didier
Author_Institution :
Microelectron. Lab., Univ. catholique de Louvain, Louvain-la-Neuve
Abstract :
Subthreshold circuits exhibit ultra-low energy per operation at the expense of increased delay. In this contribution, the impact of technology scaling on digital subthreshold circuits is investigated. Migrating from 0.25-mum to 32-nm node is shown to considerably lower the energy consumption of a subthreshold 8x8-bit RCA multiplier. When reaching the smallest nodes, limitations come from slow scaling of the static energy consumption and the deteriorating static noise margin, which raises robustness issues when considering process variability. These effects result in a loss of energy efficiency. The use of non-minimum channel length is proposed to improve energy efficiency. At 32-nm node, it reduces total energy consumption by a factor 5.
Keywords :
circuit noise; digital circuits; low-power electronics; RCA multiplier; digital subthreshold circuits; energy efficiency; nonminimum channel length; static energy consumption; static noise margin; technology scaling; Circuit noise; Delay; Energy consumption; Energy efficiency; MOSFET circuits; Microelectronics; Noise robustness; Predictive models; Throughput; Very large scale integration; CMOS digital circuits; robustness; subthreshold logic; technology scaling; ultra-low power;
Conference_Titel :
Symposium on VLSI, 2008. ISVLSI '08. IEEE Computer Society Annual
Conference_Location :
Montpellier
Print_ISBN :
978-0-7695-3291-2
Electronic_ISBN :
978-0-7695-3170-0
DOI :
10.1109/ISVLSI.2008.75