DocumentCode
2012386
Title
BSIM — Industry standard compact MOSFET models
Author
Chauhan, Yogesh Singh ; Venugopalan, Sriram ; Karim, Mohammed A. ; Khandelwal, Sourabh ; Paydavosi, Navid ; Thakur, Pankaj ; Niknejad, Ali M. ; Hu, Chenming C.
Author_Institution
Dept. of Electr. Eng., Indian Inst. of Technol. (IIT), Kanpur, India
fYear
2012
fDate
17-21 Sept. 2012
Firstpage
46
Lastpage
49
Abstract
BSIM compact models have served industry for more than a decade starting with BSIM3 and later BSIM4 and BSIMSOI. Here we will briefly discuss the ongoing work on current and future device models in BSIM group. BSIM6 is the next generation bulk RF MOSFET Model which uses charge based core with physical models adapted from BSIM4. Model fulfills all symmetry tests and shows correct slopes for harmonics. The BSIM-CMG and BSIM-IMG are the surface potential based models for multi-gate MOSFETs. The BSIM-CMG model has been developed to model common symmetric double, triple, quadruple and surround gate MOSFET. The BSIM-IMG model has been developed to model independent double-gate MOSFET capturing threshold voltage variation with back gate bias. Models include all read device effects like SCE, DIBL, mobility degradation, poly depletion, QME etc.
Keywords
MOSFET; semiconductor device models; BSIM compact model; BSIM-CMG; BSIM-IMG; BSIM3; BSIM4; BSIM6; BSIMSOI; bulk RF MOSFET model; industry standard compact MOSFET model; multigate MOSFET; surface potential based model; threshold voltage variation; Adaptation models; Computational modeling; FinFETs; Integrated circuit modeling; Logic gates; MOSFET circuits; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Device Research Conference (ESSDERC), 2012 Proceedings of the European
Conference_Location
Bordeaux
ISSN
1930-8876
Print_ISBN
978-1-4673-1707-8
Electronic_ISBN
1930-8876
Type
conf
DOI
10.1109/ESSDERC.2012.6343330
Filename
6343330
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