Title :
BSIM — Industry standard compact MOSFET models
Author :
Chauhan, Yogesh Singh ; Venugopalan, Sriram ; Karim, Mohammed A. ; Khandelwal, Sourabh ; Paydavosi, Navid ; Thakur, Pankaj ; Niknejad, Ali M. ; Hu, Chenming C.
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol. (IIT), Kanpur, India
Abstract :
BSIM compact models have served industry for more than a decade starting with BSIM3 and later BSIM4 and BSIMSOI. Here we will briefly discuss the ongoing work on current and future device models in BSIM group. BSIM6 is the next generation bulk RF MOSFET Model which uses charge based core with physical models adapted from BSIM4. Model fulfills all symmetry tests and shows correct slopes for harmonics. The BSIM-CMG and BSIM-IMG are the surface potential based models for multi-gate MOSFETs. The BSIM-CMG model has been developed to model common symmetric double, triple, quadruple and surround gate MOSFET. The BSIM-IMG model has been developed to model independent double-gate MOSFET capturing threshold voltage variation with back gate bias. Models include all read device effects like SCE, DIBL, mobility degradation, poly depletion, QME etc.
Keywords :
MOSFET; semiconductor device models; BSIM compact model; BSIM-CMG; BSIM-IMG; BSIM3; BSIM4; BSIM6; BSIMSOI; bulk RF MOSFET model; industry standard compact MOSFET model; multigate MOSFET; surface potential based model; threshold voltage variation; Adaptation models; Computational modeling; FinFETs; Integrated circuit modeling; Logic gates; MOSFET circuits; Threshold voltage;
Conference_Titel :
Solid-State Device Research Conference (ESSDERC), 2012 Proceedings of the European
Conference_Location :
Bordeaux
Print_ISBN :
978-1-4673-1707-8
Electronic_ISBN :
1930-8876
DOI :
10.1109/ESSDERC.2012.6343330