DocumentCode :
2012631
Title :
ERT imaging and linkage to CFD for stirred vessels in the chemical process industry
Author :
Mann, R.
Author_Institution :
Sch. of Chem. Eng. & Anal. Sci., Univ. of Manchester, Manchester
fYear :
2009
fDate :
11-12 May 2009
Firstpage :
218
Lastpage :
222
Abstract :
Stirred vessels in the chemical process industry are largely devoid of instrumentation, which can visualise the internal concentrations and phase distribution. An electrical resistance tomography (ERT) system installed on a 1 metre/1 tonne scale pilot plant vessel is described. Some earlier applications showing how fluid mixing and precipitation can be imaged in time and space using solid-body graphics are described based on pseudo-3D assembly of several axial sensing planes. Simplified computational fluid dynamics (CFD) provides a density of predictions, which is commensurate with the multiple interior point detail O (103) furnished by the ERT system. More recent improvements are portrayed, which use full 3D interrogation of the fluid space coupled with fully 3D reconstruction from a set of peripheral measurements. Simplified CFD also emphasises the potential for ERT imaging of batch-fed bioreactors. Potential future developments of this imaging technology are briefly presented.
Keywords :
batch processing (industrial); bioreactors; chemical industry; computational fluid dynamics; computer graphics; electrical resistivity; image reconstruction; mixing; precipitation; tomography; 3D reconstruction; CFD; ERT imaging technology; batch-fed bioreactors; chemical process industry; computational fluid dynamics; electrical resistance tomography system; fluid mixing; precipitation; pseudo3D assembly; solid-body graphics; stirred vessels; Chemical industry; Chemical processes; Computational fluid dynamics; Couplings; Electric resistance; Graphics; Instruments; Space technology; Tomography; Visualization; CFD; ERT; chemical process; mixing; visualisation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Imaging Systems and Techniques, 2009. IST '09. IEEE International Workshop on
Conference_Location :
Shenzhen
Print_ISBN :
978-1-4244-3482-4
Electronic_ISBN :
978-1-4244-3483-1
Type :
conf
DOI :
10.1109/IST.2009.5071637
Filename :
5071637
Link To Document :
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