Title :
Setup and Hold Timing Violations Induced by Process Variations, in a Digital Multiplier
Author :
Rebaud, B. ; Belleville, M. ; Bernard, C. ; Wu, Z. ; Robert, M. ; Maurine, P. ; Azemard, N.
Author_Institution :
CEA, LETI-MINATEC, Grenoble
Abstract :
This article aims at highlighting new design issues coming from the increasing sensitivity of digital circuits towards process variability. CAD tools and current design methodologies are not anymore efficient to tackle such aspects. In particular variability is increasing the difficulty to identify setup and hold time violations. This paper is a study of failure probabilities considering device process variations on several long and short paths extracted from a RTL MAC Multiplier-Accumulator physical synthesis. This study is based on a Statistical Static Timing Analysis method, used on combinatory cells, mixed with Monte Carlo Analysis applied on sequential cells. This allows the manipulation of probability distribution functions and thus, to keep all the variability information. Setup time, hold time, and delay propagation variation figures are extracted thanks to this methodology. Several results on combinatory paths and flip-flop cells are given to underline the variability impacts.
Keywords :
Monte Carlo methods; circuit CAD; digital circuits; multiplying circuits; CAD tools; Monte Carlo analysis; RTL MAC multiplier-accumulator physical synthesis; Statistical Static Timing Analysis method; combinatory cells; digital circuits; digital multiplier; flip-flop cells; hold time violations; probability distribution functions; process variations; setup time violations; Data mining; Delay effects; Design automation; Design methodology; Digital circuits; Flip-flops; Monte Carlo methods; Probability distribution; Propagation delay; Timing; Monte Carlo; Statistical Static Timing Analysis (SSTA); Variability; hold time; setup time;
Conference_Titel :
Symposium on VLSI, 2008. ISVLSI '08. IEEE Computer Society Annual
Conference_Location :
Montpellier
Print_ISBN :
978-0-7695-3291-2
Electronic_ISBN :
978-0-7695-3170-0
DOI :
10.1109/ISVLSI.2008.70