DocumentCode :
2012753
Title :
FDTD modeling of a SIW based sensor for THz diagnostics
Author :
Bozza, Giovanni ; Caviglia, Daniele D. ; Pastorino, Matteo
Author_Institution :
Dept. of Biophys. & Electron. Eng., Univ. of Genoa, Genoa
fYear :
2009
fDate :
11-12 May 2009
Firstpage :
258
Lastpage :
262
Abstract :
In this contribution finite-difference time-domain (FDTD) modeling and simulations of sensors for Terahertz (THz) diagnostics are described. substrate integrated waveguide (SIW) structures are addressed and their potential use as sensors is evaluated in some configurations of interest. In particular, the considered THz sensor is obtained by means of an open SIW waveguide which transmits and receives the electromagnetic waves used for the inspection of the target under test. Substrate integrated waveguides allow THz waves propagation by using quite standard Printed Circuit Board (PCB) technology and so they may be good candidates for obtaining guiding structures in the THz band with moderate costs and the possibility of integration with other devices. The adopted FDTD simulator is able to take into account of both the propagation inside the SIW and the interactions of THz waves with dielectric structures.
Keywords :
electromagnetic wave transmission; finite difference time-domain analysis; printed circuits; substrate integrated waveguides; terahertz wave detectors; FDTD simulator model; SIW based sensor diagnostics; SIW dielectric structure; electromagnetic wave transmission; standard printed circuit board technology; substrate integrated waveguide; terahertz wave band sensor; Circuit testing; Electromagnetic propagation; Electromagnetic scattering; Electromagnetic waveguides; Finite difference methods; Inspection; Printed circuits; Sensor phenomena and characterization; Time domain analysis; Waveguide components;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Imaging Systems and Techniques, 2009. IST '09. IEEE International Workshop on
Conference_Location :
Shenzhen
Print_ISBN :
978-1-4244-3482-4
Electronic_ISBN :
978-1-4244-3483-1
Type :
conf
DOI :
10.1109/IST.2009.5071645
Filename :
5071645
Link To Document :
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