• DocumentCode
    2013009
  • Title

    Enhanced nanometer-scale infrared spectroscopy with a contact mode microcantilever having an internal resonator paddle

  • Author

    Felts, J.R. ; Kjoller, K. ; Prater, C.B. ; King, W.P.

  • Author_Institution
    Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • fYear
    2010
  • fDate
    24-28 Jan. 2010
  • Firstpage
    136
  • Lastpage
    139
  • Abstract
    Infrared (IR) spectroscopy is one of the most widely used analytical techniques to measure the chemical composition of organic materials. IR spectra can lead to identification of specific chemical species, but the diffraction limit prohibits IR spectroscopy from probing regions smaller than about 5 ¿m. This paper demonstrates IR spectroscopy with 100 nm spatial resolution using a tunable IR laser and a vibrating atomic force microscope cantilever. Novel microcantilevers transduce thermomechanical pulses from the laser, with a factor of 6 signal-to-noise improvement over conventional microcantilevers. We show 100 nm IR spectroscopy for chemical identification of ethylene acrylic acid (EAA) and Nylon.
  • Keywords
    atomic force microscopy; cantilevers; cavity resonators; infrared spectroscopy; micromechanical devices; Nylon; chemical composition; contact mode microcantilever; ethylene acrylic acid; internal resonator paddle; nanometer-scale infrared spectroscopy; organic materials; signal-to-noise improvement; spatial resolution; thermomechanical pulses; vibrating atomic force microscope cantilever; Atomic force microscopy; Chemical analysis; Chemical lasers; Diffraction; Infrared spectra; Organic chemicals; Organic materials; Spatial resolution; Spectroscopy; Tunable circuits and devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems (MEMS), 2010 IEEE 23rd International Conference on
  • Conference_Location
    Wanchai, Hong Kong
  • ISSN
    1084-6999
  • Print_ISBN
    978-1-4244-5761-8
  • Electronic_ISBN
    1084-6999
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2010.5442546
  • Filename
    5442546