Title :
Enhanced nanometer-scale infrared spectroscopy with a contact mode microcantilever having an internal resonator paddle
Author :
Felts, J.R. ; Kjoller, K. ; Prater, C.B. ; King, W.P.
Author_Institution :
Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Abstract :
Infrared (IR) spectroscopy is one of the most widely used analytical techniques to measure the chemical composition of organic materials. IR spectra can lead to identification of specific chemical species, but the diffraction limit prohibits IR spectroscopy from probing regions smaller than about 5 ¿m. This paper demonstrates IR spectroscopy with 100 nm spatial resolution using a tunable IR laser and a vibrating atomic force microscope cantilever. Novel microcantilevers transduce thermomechanical pulses from the laser, with a factor of 6 signal-to-noise improvement over conventional microcantilevers. We show 100 nm IR spectroscopy for chemical identification of ethylene acrylic acid (EAA) and Nylon.
Keywords :
atomic force microscopy; cantilevers; cavity resonators; infrared spectroscopy; micromechanical devices; Nylon; chemical composition; contact mode microcantilever; ethylene acrylic acid; internal resonator paddle; nanometer-scale infrared spectroscopy; organic materials; signal-to-noise improvement; spatial resolution; thermomechanical pulses; vibrating atomic force microscope cantilever; Atomic force microscopy; Chemical analysis; Chemical lasers; Diffraction; Infrared spectra; Organic chemicals; Organic materials; Spatial resolution; Spectroscopy; Tunable circuits and devices;
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2010 IEEE 23rd International Conference on
Conference_Location :
Wanchai, Hong Kong
Print_ISBN :
978-1-4244-5761-8
Electronic_ISBN :
1084-6999
DOI :
10.1109/MEMSYS.2010.5442546