DocumentCode :
2013166
Title :
Notice of Retraction
Adsorption of chitosan and interaction with a non-ionic surfactant on silica
Author :
Liu Bingtao ; Fokkink, R. ; de Keizer, A.
Author_Institution :
Sch. of municipal & Environ. Eng., North China Inst. of Water Conservancy & Hydroelectric Power, Zhengzhou, China
Volume :
1
fYear :
2010
fDate :
17-18 July 2010
Firstpage :
337
Lastpage :
340
Abstract :
Notice of Retraction

After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.

We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.

The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.

Optical reflectometry is applied as a tool for studying single and simultaneous adsorption of a carbohydrate, a nonionic surfactant, and a protein, For the nonionic surfactant poly(ethylene oxide) alkyl ether on a silica surface the adsorption process is fast and reversible, and the maximum adsorbed amount was 2.45 mg·m-2. Also, the effect of pH on the adsorption of chitosan on silica, and its interaction with C12EO5 have been studied. The maximum adsorbed amount was obtained for pH ≥ 6.8 (0.80 mg·m-2). Changes in surface functionality upon adsorbing C12EO5 on a chitosan layer and the protein, bovine serum albumin, are reported. The results are discussed in terms of adsorption kinetics, adsorbed mass plateau values, and reversibility of layer formation.
Keywords :
adsorption; reflectometry; surfactants; adsorbed mass plateau; adsorption kinetics; chitosan; nonionic surfactant; optical reflectometry; silica; Biomedical measurements; Displacement measurement; Materials; Optical filters; Optical switches; Solvents; adsorption; chitosan; reflectomety; surfactants;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Environmental Science and Information Application Technology (ESIAT), 2010 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-7387-8
Type :
conf
DOI :
10.1109/ESIAT.2010.5568573
Filename :
5568573
Link To Document :
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