Abstract :
Conference proceedings front matter may contain various advertisements, welcome messages, committee or program information, and other miscellaneous conference information. This may in some cases also include the cover art, table of contents, copyright statements, title-page or half title-pages, blank pages, venue maps or other general information relating to the conference that was part of the original conference proceedings.
Keywords :
VLSI; automatic test pattern generation; boundary scan testing; built-in self test; fault diagnosis; integrated circuit testing; integrated memory circuits; IDDQ test; STIL extension; VLSI test; analog BIST; analog test techniques; crosstalk; defect driven techniques; delay test; design validation; fault tolerance; functional test; high level ATPG; jitter; low power BIST; memory test; microprocessor test; online testing; open defect detection; process drift issues; scan related approaches; system-on-chip test techniques; technology trends; temperature drift; test compaction; test scheduling; verification issues;
